Pseudo-ring tests resolution for dynamic single faults in word-oriented memory

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چکیده

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ژورنال

عنوان ژورنال: Технология и конструирование в электронной аппаратуре

سال: 2018

ISSN: 2309-9992,2225-5818

DOI: 10.15222/tkea2018.5-6.03