Pseudo-ring tests resolution for dynamic single faults in word-oriented memory
نویسندگان
چکیده
منابع مشابه
Detecting Intra-Word Faults in Word-Oriented Memories
This paper improves upon the state of the art in testing word oriented memories. It first presents a complete set of fault models for intra-word coupling faults. Then, it establishes the data background sequence (DBS) for each intraword coupling fault. These DBSs will be compiled into a (1+ 28 blog2Bc) n B test with complete fault coverage of the target faults, where n is the size of the memory...
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Said Hamdioui1;2 A. J. van de Goor2 1Intel Corporation, 2200 Mission College Boulevard, Santa Clara, CA 95052 2Se tion Computer Ar hite ture & Digital Te hnique, Department of Ele tri al Engineering Fa ulty of Information Te hnology and Systems, Delft University of Te hnology Mekelweg 4, 2628 CD Delft, The Netherlands E-mail: (said,vdgoor) ardit.et.tudelft.nl Abstra t This paper presents an app...
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ژورنال
عنوان ژورنال: Технология и конструирование в электронной аппаратуре
سال: 2018
ISSN: 2309-9992,2225-5818
DOI: 10.15222/tkea2018.5-6.03